Beilstein J. Nanotechnol.2016,7, 1736–1742, doi:10.3762/bjnano.7.166
Lothar Leidner Julia Stab Jennifer T. Adam Gunter Gauglitz Institute of Physical and Theoretical Chemistry (IPTC), Eberhard Karls University of Tübingen, Auf der Morgenstelle 18, 72076 Tübingen, Germany 10.3762/bjnano.7.166 Abstract Reflectometricinterferencespectroscopy (RIfS), which is well
results are compared with a similar experiment performed with an ATR (attenuated total reflectance) set-up.
Keywords: attenuated total reflectance Fourier transform infrared spectroscopy (ATR-FTIR); direct optical sensing; mid-infrared regime (MIR); reflectometricinterferencespectroscopy; surface
thin films.
Results and Discussion
Reflectometricinterferencespectroscopy in the mid-infrared
Reflectometricinterferencespectroscopy (RIfS) is a well-established sensor concept for direct optical sensing in the visible wavelength region of the electromagnetic spectrum. It can be used both as a
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Figure 1:
Amplification of water OH-stretching band (measurements with the Teflon sensor).